In this talk, I would discuss how one can utilize the soft X-ray coherent diffractive imaging to get quantitative nanoscale spectroscopic information about the transient chemical states and heterogeneity of photoexcited insulator-to-metal phase transition in vanadium oxide (VO2) thin films. Further, as a stepping stone toward quantitative 3D hard X-ray Bragg imaging of strain field, I would discuss the recent results obtained from ultrafast hard X-ray Bragg diffraction measurements of phase competition in photoexcited strain-engineered epitaxial thin films of VO2.
Na spletni strani uporabljamo izključno piškotke, ki so dovoljeni v skladu z zakonom ZEKom-1. Uporabljeni so le piškotki, ki so nujno potrebni za delovanje te spletne strani. Za beleženje statistike obiskanosti strani, uporabljamo sistem, ki zapiše le sejni piškotek in ne sledi vašemu nadaljnemu vedenju na spletni strani oz. v povezavi z drugimi stranmi. Z nadaljno uporabo te spletne strani se strinjate z rabo v opisanih piškotkov.